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The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the ...

DETAILS

  • LabVIEW based Automation Guide for Microwave Measurements
  • Dubey, Satya Kesh, Narang, Naina, Negi, P. S.
  • Kartoniert, xiv, 45 S.
  • XIV, 45 p. 31 illus. in color.
  • Sprache: Englisch
  • 235 mm
  • ISBN-13: 978-981-10-6279-7
  • Titelnr.: 65500111
  • Gewicht: 124 g
  • Springer, Berlin (2017)
  • Herstelleradresse

    Springer Heidelberg

    Tiergartenstr. 17

    69121 - DE Heidelberg

    E-Mail: buchhandel-buch@springer.com

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