
- Dubey, Satya Kesh
- Narang, Naina
- Negi, P. S.
LabVIEW based Automation Guide for Microwave Measurements
- Kartoniert,
- 1st ed. 2018,
- Springer, Berlin
- (2017)
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The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the ...
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- LabVIEW based Automation Guide for Microwave Measurements
- Dubey, Satya Kesh, Narang, Naina, Negi, P. S.
- Kartoniert, xiv, 45 S.
- XIV, 45 p. 31 illus. in color.
- Sprache: Englisch
- 235 mm
- ISBN-13: 978-981-10-6279-7
- Titelnr.: 65500111
- Gewicht: 124 g
- Springer, Berlin (2017)
Herstelleradresse
Springer Heidelberg
Tiergartenstr. 17
69121 - DE Heidelberg
E-Mail: buchhandel-buch@springer.com
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